Atomic force microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that utilizes a laser beam and a cantilever with a sharp tip to scan the surface of a sample in order to generate high-resolution images. It allows for the visualization and measurement of nanoscale surface topography, as well as the characterization of mechanical, magnetic, and electrical properties at the atomic level.
About
It allows for the visualization and measurement of nanoscale surface topography, as well as the characterization of mechanical, magnetic, and electrical properties at the atomic level. The AFM technique involves bringing the tip of the cantilever into close proximity with the sample's surface and measuring the force exerted between them, which provides information about the surface's properties. AFM has a wide range of applications in various fields including materials science, biology, chemistry, and nanotechnology. It has greatly contributed to the understanding of surface and interface phenomena, as well as the development of new materials and devices.